Abstracts for Annual Meeting of the Mineralogical Society of Japan
Abstracts for the Meeting (2004) of the Mineralogical Society of Japan
Session ID : k02-04
Conference information
X-Ray Photoelectron Microscopic Imaging of the Chemical Bonding State of Si in a Rock Sample
*Haruhiko Seyama, Daoyuan Wang, Mitsuyuki Soma
Author information
Keywords: XPS, microscopy, Si, chemical bonding state, silicate mineral
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Download PDF (326K)
Download citation RIS

(compatible with EndNote, Reference Manager, ProCite, RefWorks)

BIB TEX

(compatible with BibDesk, LaTeX)

Text
How to download citation
Contact us
Abstract
[in Japanese]
Content from these authors
© 2004 Japan Association of Mineralogical Sciences
Previous article Next article
Favorites & Alerts

Recently viewed articles
Successor

Abstracts for Annual Meeting of Japan Association of Mineralogical Sciences

Share this page
feedback
 Top