characterization of synthetic quartz crystals grown oncylindrical seeds logg in X, Y and Z directions by the X-ray topography.

Abstract

Synthetic quartz crystals for quartz resonators production are usually grown on seeds such as Y-bar or Z-plate along in Y-direction. Y-cut plate of such synthetic crystals shows six distinct growth regions of +X, -X, two Z and two S regions. For quartz resonator fabrication, Z-growth regions are favored due to higher purity and lower amount of defects such as dislocations. The present study demonstrates the application of the cylindrical seed crsytals long in X, Y and Z directions, and the features of the grown crystals were investigated by the X-ray topography.