Abstracts for Annual Meeting of the Mineralogical Society of Japan
2005 Annual Meeting of the Mineralogical Society of Japan
Session ID : K1-P10
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Application of FIB technique to high-pressure mineralogy
*Hiroaki Ohfuji, Tetsuo Irifune, Maiko Isshiki, Sakamoto Shizue
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Keywords: focused ion beam, transmission electron microscope, multianvil apparatus, diamond anvil cell
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[in Japanese]

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© 2005 Japan Association of Mineralogical Sciences
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