Published: 2022 Received: -Available on J-STAGE: March 25, 2022Accepted: November 27, 2021
Advance online publication: -
Revised: -
Correction information
Date of correction: March 28, 2022Reason for correction: Correction of errorsCorrection: ReferencesDetails: References Wrong:ISCAS89SequentialBenchmarkCircuits / Right:ISCAS89 Sequential Benchmark Circuits
Validness of the stochastic testability proposed by the author is verified. As a result of applying to the ISCAS89 s27 benchmark circuit, the number of test patterns for stuck-at faults is calculated accurately. This shows that the proposed method is valid as a testability.
