Abstract
We realized real space imaging of transient carrier dynamics by combining ultrashort pulse laser
technology with scanning tunneling microscopy (STM). The new microscopy, called shaken-pulse-pair
excited STM (SPPX-STM), simultaneously has the temporal resolution of ultrashort laser pulse width
and the spatial resolution of STM. We successfully imaged carrier dynamics in semiconductors with
nanoscale structures in real space by the new microscopy techniques.
