Observation Experiment of Material Dynamics under Laser-Shock Compression with In-situ Real Time X-ray Diffraction

Abstract

We performed measurement of laser-shock compressed silicon along [001] orientation using in-situ wide-angle x-ray diffraction technique and line-imaging velocimetry (VISAR). The x-ray diffraction detector fi lm recorded x-rays that are diffracted from multiple lattice planes. These diffracted x-rays indicate uncompressed state and compressed state. VISAR interferometry image shows a specifi c rearsurface velocity change indicating that a shock wave propagate in the silicon target. These data provide information on the crystal structure and stress state under shock compression.