The Review of Laser Engineering
Online ISSN : 1349-6603
Print ISSN : 0387-0200
ISSN-L : 0387-0200
Laser Review
Optical Nano-Artifact Metrics Using White-Light Interferometric Measurement
Naoki YOSHIDA, Tsutomu MATSUMOTO
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Keywords: Nano-artifact metrics, White light interferometer, Interference image, Security, Identity management
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2019 Volume 47 Issue 6 Pages 295-

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Abstract
Nano-artifact metrics exploits the unique physical attributes of nanostructured matter for authentication. The crucial point is how to read and utilize nanostructured matter. This article cites work on optical nano-artifact metrics using a white-light interferometric measurement.
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© 2019 by The Laser Society of Japan
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