The Review of Laser Engineering
Online ISSN : 1349-6603
Print ISSN : 0387-0200
ISSN-L : 0387-0200
Characterization of Defects in Crystals by Laser Scattering CT
Taijing LUKoichi TOYODANobuhito NANGOTomoya OGAWA
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1991 Volume 19 Issue 5 Pages 440-450

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Abstract
Theories of light scattering from lattice detects of crystals induced by an incident laser beam from an electromagnetic wave point of view and the detection method and instrument of light scattering are reviewed. Microdefects and microprecipitates in crystals were non-destructively detected and characterizied in the bulk and near surface of crytals by laser light scattering tomography. The three dimensional distribution of defects in crystals can be obtained by layer-by-layer tomographic observation. Some results of observation will be done here about the microdefects in semiconductive crystals by a method using a YAG laser beam.
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© The Laser Society of Japan
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