Journal of the Mass Spectrometry Society of Japan
Online ISSN : 1880-4225
Print ISSN : 1340-8097
ISSN-L : 1340-8097
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Imaging Mass Spectrometry with Swift Heavy Ions
Yoshihiko NAKATAHideaki YAMADAYoshiro HONDASatoshi NINOMIYAToshio SEKITakaaki AOKIJiro MATSUO
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2008 Volume 56 Issue 4 Pages 201-208

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Abstract
In this paper, we describe mass spectrometric techniques using swift heavy ions, for biological application. Desorption of large biomolecular ions due to irradiation by swift heavy ions was first observed in 1974, and the time-of-flight mass spectrometry using fission fragments from a 252Cf source is called plasma desorption mass spectrometry (PDMS). PDMS has been successfully applied in the detection of large biomolecules up to 20 kDa. However, the number of PDMS studies decreased after the emergence of fast atom bombardment (FAB). In recent years, a new mass spectrometric technique, which is called imaging mass spectrometry, has attracted attention, and numerous studies have been conducted on matrix assisted laser desorption/ionization (MALDI) and secondary ion mass spectrometry (SIMS). We have developed a new system for imaging mass spectrometry using MeV-ion beams, which is termed MeV-SIMS. High-resolution MeV-SIMS imaging requires high secondary ion yields, beam focusing, and careful sample preparation. Here, we present our results on MeV-SIMS imaging and future prospects.
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© 2008 by The Mass Spectrometry Society of Japan
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