Journal of the Mass Spectrometry Society of Japan
Online ISSN : 1880-4225
Print ISSN : 1340-8097
ISSN-L : 1340-8097
Electlical Deflection Type Mass Spectrometer II
FUTOSHI KANEMATSUHIROSHI MIMAYOSHIYUKI NAKAI
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1968 Volume 16 Issue 4 Pages 405-413

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Abstract
Performance test of the electrical deflection type mass. spectrometer, being proposed in our previous paper, was carried out. Four stage type test tube showed the resolving power of about 6. On the other hand, if we assume an idealized deflection field and a well-focussed monochromatic ion beam, the resolving power of the tube is estimated to about 60. The discrepancy between theory and experiment is mainly caused by the following factors. 1. Fringing effect of the condenser field (a)weakening of the deflection field in boundary regions between adjacent condensers. (b)existense of the electric field component in the direction of tube axis which varies ion's axial velocity which must be constant. 2. Directional distribution of the ion beam. 3. Transit time of the rf deflection voltage, at the instant of phase inversion. The effect of the other factors, such as the energy distribution of beam ions which due to the ion source character, the constructional exactness of the electrode system, etc, was found to be sufficiently small in the present stage of experiment.
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