Published: November 25, 1974Received: November 25, 1974Available on J-STAGE: June 28, 2010Accepted: -
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Correction information
Date of correction: June 28, 2010Reason for correction: -Correction: DTRECEIVEDDetails: Right : 19741125
Date of correction: June 28, 2010Reason for correction: -Correction: CITATIONDetails: Wrong : E E E E E E
Right : H. Liebl, J. Appl. Phys., 38, 5277(1967). A. Benninghoven and E. Loebach, Rev. Sci. Instrum., 42, 49(1971). L. Wahlin, Nuclear Instrum. and Methods, 27, 55(1964). Inoue et al., OYO BUTURI, 40, 26(1971). R. L. Seliger, J. Appl. Phys., 43, 2352(1972). H. Tamura, T. Kondo and T. Hirano,“Proc. the Sixth Intl.. Conf.on X-ray Optics and Microanalysis”, University of Tokyo Press, Tokyo(1972), p. 423.
