Materia Japan
Online ISSN : 1884-5843
Print ISSN : 1340-2625
ISSN-L : 1340-2625
Diagnostic Nano-scale Analysis of Electronic Structures by Complex Electron Spectroscopic Methods
Shunsuke Muto, Tomoko Yoshida, Kazuyoshi Tatsumi
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Keywords: (scanning) transmission electron microscopy, electron energy-loss spectroscopy, soft x-ray emission spectroscopy, multivariate curve resolution, diagnostic analysis, Pixon method, spectrum imaging
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2009 Volume 48 Issue 6 Pages 290-293

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© 2009 The Japan Institute of Metals and Materials
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