Materia Japan
Online ISSN : 1884-5843
Print ISSN : 1340-2625
ISSN-L : 1340-2625
Structural Analysis of Surface Layers using X-ray Scattering at Small Glancing Angle of Incidence
Yoshikazu Fujii
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Keywords: structural analysis of surface layers, depth profile analysis of poly-crystalline surface layers, X-ray diffraction at small glancing angle of incidence, crystal grain size, surface strain distribution by residual stresses
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2009 Volume 48 Issue 9 Pages 445-451

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