Complex Point Defect Structure in Cubic Boron Nitride
Ryo Ishikawa, Naoya Shibata, Yuichi Ikuhara, Fumiyasu Oba, Scott D. Findlay, Takashi Taniguchi, Isao Tanaka
Author information
Keywords:
atomic-resolution ADF STEM (annular dark-field scanning transmission electron microscopy),
EELS (electron energy-loss spectroscopy),
single atom imaging,
high-pressure and high-temperature synthesis,
optical luminescence
2016 Volume 55 Issue 12 Pages 609
Details
Article 1st page
