Materia Japan
Online ISSN : 1884-5843
Print ISSN : 1340-2625
ISSN-L : 1340-2625
Current Technology Trends of Transmission Electron Microscopy and Their Future Perspective (Electron Spectroscopy)
Shunsuke Muto
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Keywords: scanning/transmission electron microscopy, electron energy-loss spectroscopy, spectral imaging, multivariate analysis, dynamical electron inelastic scattering, chemical state analysis, electron magnetic circular dichroism, electron channeling
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2017 Volume 56 Issue 3 Pages 249-253

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