Materia Japan
Online ISSN : 1884-5843
Print ISSN : 1340-2625
ISSN-L : 1340-2625
Electron microscope control and image analysis by DigitalMicrograph
Ryo Ishikawa, Riku Tanaka, Naoya Shibata, Yuichi Ikuhara
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Keywords: digital micrograph, scripting, atomic-resolution STEM, differential phase contrast STEM, image analysis
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2018 Volume 57 Issue 12 Pages 584-588

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