Materia Japan
Online ISSN : 1884-5843
Print ISSN : 1340-2625
ISSN-L : 1340-2625
Recent Advances in 3D Atom Probe Analysis
Taisuke Sasaki, Jun Uzuhashi, Tadakatsu Ohkubo, Kazuhiro Hono
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Keywords: three-dimensional atom probe (3DAP), transmission electron microscope (TEM), focused ion beam (FIB), structural materials, functional materials
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2022 Volume 61 Issue 2 Pages 72-77

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