Materia Japan
Online ISSN : 1884-5843
Print ISSN : 1340-2625
ISSN-L : 1340-2625
Recent Research
Advances in Characterization of Thick Specimens and Time-Resolved In-situ Observation by Modern High Voltage Electron Microscopy
Kazuhisa Sato
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Keywords: high-voltage electron microscopy, maximum usable thickness, crystal defects, threading dislocations, in-situ observation, cryo-electron microscopy, direct electron detection camera
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2024 Volume 63 Issue 4 Pages 236-242

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