Bulletin of the Japan Institute of Metals
Online ISSN : 1884-5835
Print ISSN : 0021-4426
ISSN-L : 0021-4426
Trace Element Determination by X-ray Fluorescence Analysis
Atsuo Iida, Yohichi Gohshi
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Keywords: X-ray fluorescence analysis, trace element analysis, synchrotron radiation, micro analysis, X-ray total reflection
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1985 Volume 24 Issue 11 Pages 956-961

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