Materia Japan
Online ISSN : 1884-5843
Print ISSN : 1340-2625
ISSN-L : 1340-2625
High-resolution Transmission Electron Microscopy of Semiconductor Hetero-epitaxial Interfacial Structures
Nobuyuki IkarashiKoichi Ishida
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1998 Volume 37 Issue 12 Pages 1003

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© The Japan Institute of Metals
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