Materia Japan
Online ISSN : 1884-5843
Print ISSN : 1340-2625
ISSN-L : 1340-2625
Low-dimensional Surface Observation by Scanning Tunneling Microscopy with Ultra-low Bias Voltage
Daisuke Fujita
Author information
JOURNAL FREE ACCESS

2002 Volume 41 Issue 12 Pages 846-847

Details
Article 1st page
Content from these authors
© The Japan Institute of Metals
Previous article Next article
feedback
Top