Materia Japan
Online ISSN : 1884-5843
Print ISSN : 1340-2625
ISSN-L : 1340-2625
Interface Studies Using Aberration-corrected STEM
Naoya Shibata
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Keywords: Z-contrast, Scanning transmission electron microscopy, interface, grain boundary, aberration correction, silicon nitride, grain growth
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2005 Volume 44 Issue 10 Pages 852-855

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