Materia Japan
Online ISSN : 1884-5843
Print ISSN : 1340-2625
ISSN-L : 1340-2625
Atomic Column by Column EELS Mapping by Cs Corrected STEM
Eiji Okunishi, Hidetaka Sawada
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Keywords: Cs corrector, scanning transmission electron microscope, atomic column, electron energy loss spectroscopy map, spectrum imaging
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2006 Volume 45 Issue 12 Pages 865

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