Materia Japan
Online ISSN : 1884-5843
Print ISSN : 1340-2625
ISSN-L : 1340-2625
Charge Density Analysis of Silicon using Convergent-Beam Electron Diffraction
Yoichiro Ogata, Kenji Tsuda, Michiyoshi Tanaka
Author information
Keywords: convergent-beam electron diffraction, dynamical diffraction, charge density, covalent bonding
JOURNAL FREE ACCESS

2006 Volume 45 Issue 12 Pages 885

Details
Download PDF (1110K)
Download citation RIS

(compatible with EndNote, Reference Manager, ProCite, RefWorks)

BIB TEX

(compatible with BibDesk, LaTeX)

Text
How to download citation
Contact us
Article 1st page
Content from these authors
© The Japan Institute of Metals
Previous article Next article
Favorites & Alerts

Recently viewed articles
Predecessor

Bulletin of the Japan Institute of Metals

Share this page
feedback
 Top