Materia Japan
Online ISSN : 1884-5843
Print ISSN : 1340-2625
ISSN-L : 1340-2625
X-Ray Diffraction Microscopy for Nanostructure Analysis
Yoshinori Nishino, Tetsuya Ishikawa
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Keywords: x-ray diffraction microscopy, nanostructure analysis, coherent x-rays, oversampling, iterative method
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2006 Volume 45 Issue 2 Pages 99-105

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