Abstract
Two-dimensional regular aggregates of thin flakes of some layer-silicates and gold were studied under the electron microscope, and those of SiC crystals by optical microscopy and X-ray diffraction. The results of the observations were interpreted in terms of the concept of compound tessellation, and some examples of ‘pseudo compound tessellation’ were presented. It was concluded that when crystals of layer structure come into contact with each other, they prefer to have their basal planes in common and to take mutual crystallographic orientations in which as many lattice points as possible per unit area in the basal plane of one of crystals fall into exact or approximate coincidence with those in the adjacent crystal.
