Development of Motion Artifact Reduction Methods in Synchrotron Radiation-based Micro X-ray CT

Abstract

Synchrotron radiation (SR)-based micro X-ray CT enables high-resolution three-dimensional observations with the micrometer scale by leveraging the high intensity, parallelism, and monochromaticity of SR. However, image degradation due to motion artifacts caused by sample displacement during long acquisition times, which typically range from several minutes to several hours, remains a significant challenge. In this study, we developed a software-based method to suppress such artifacts by detecting sample displacement through matching projection images acquired at rotation angles of 0°, 180°, and 360°, followed by displacement correction. The underlying principle of this approach, an overview of SR-based micro X-ray CT, and its performance, demonstrated through both numerical simulations and experimental data, are presented.