[Invited Paper] High Precision Measurement of Twist Elastic Constant K22 of Liquid Crystal Materials using Ellipsometry Analysis

Takahiro Ishinabe; Yuzuka Morita; Yuji Ohno; Tetsuya Miyashita; Hideo Fujikake; Tatsuo Uchida

doi:10.3169/mta.2.52

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[Invited Paper] High Precision Measurement of Twist Elastic Constant K22 of Liquid Crystal Materials using Ellipsometry Analysis

Takahiro Ishinabe, Yuzuka Morita, Yuji Ohno, Tetsuya Miyashita, Hideo Fujikake, Tatsuo Uchida

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Keywords: Liquid crystal, Twisted nematic, Elastic constant measurement, K22, Ellipsometry analysis, Director profile simulation

JOURNAL FREE ACCESS

2014 Volume 2 Issue 1 Pages 52-59

DOI https://doi.org/10.3169/mta.2.52

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Abstract

We proposed a simple and accurate method for measuring the twist elastic constant K22 of liquidcrystal materials. The novel technique is based on the ellipsometry analysis, and determines the director profile of a twisted nematic liquid crystal cell in the on state. We validated this experimentally, and showed that it is effective for evaluating the response characteristics of liquid crystal displays.

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