[Paper] A Low Noise and High Sensitivity Image Sensor with Imaging and Phase-Difference Detection AF in All Pixels

Masahiro Kobayashi; Michiko Johnson; Yoichi Wada; Hiromasa Tsuboi; Hideaki Takada; Kenji Togo; Takafumi Kishi; Hidekazu Takahashi; Takeshi Ichikawa; Shunsuke Inoue

doi:10.3169/mta.4.123

Special Section on Advanced Image Sensor Technology

[Paper] A Low Noise and High Sensitivity Image Sensor with Imaging and Phase-Difference Detection AF in All Pixels

Masahiro Kobayashi, Michiko Johnson, Yoichi Wada, Hiromasa Tsuboi, Hideaki Takada, Kenji Togo, Takafumi Kishi, Hidekazu Takahashi, Takeshi Ichikawa, Shunsuke Inoue

Author information

Keywords: CMOS image sensor, phase-difference detection AF (PDAF), image plane PDAF, separated photodiodes, PN junction separation

JOURNAL FREE ACCESS

2016 Volume 4 Issue 2 Pages 123-128

DOI https://doi.org/10.3169/mta.4.123

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Abstract

In this paper, we describe a device structure and optical design for a CMOS image sensor with phase-difference detection photodiodes (PD) for autofocus (AF) function. The individual pixel of this image sensor is composed of two horizontally displaced PDs separated by a PN junction. All the effective pixels function as both the imaging and the phase-difference detection AF (PDAF). We have realized a low dark random noise (1.8e- at 1PD, 2.5e- at 1pixel) and high sensitivity (78Ke-/lx.sec at 1green pixel) image sensor with the imaging and the PDAF functions in all the effective pixels.

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