Proceedings of The ITE National Convention
Online ISSN : 2433-0949
17
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Life Test of GaP NEA Devices
Tokuzo Sukegawa, Hironobu Katsuno, Masaru Kaneko, Hirofumi Kan
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Pages 71-72

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© 1981 The Institute of Image Information and Television Engineers
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PROCEEDINGS OF THE ITE ANNUAL CONVENTION

Proceedings of The ITE Annual Convention

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