Proceedings of The ITE National Convention
Online ISSN : 2433-0949
21
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Heat-and Light-Resistance Characteristics of a Single-Chip MOS Imaging Device
Norio KOIKE, Toshio NAKANO, Akira SASANO, Yoshio TANIGUCHI, Iwao TAKEMOTO
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Pages 61-62

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© 1985 The Institute of Image Information and Television Engineers
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PROCEEDINGS OF THE ITE ANNUAL CONVENTION

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