1974 Volume 1974 Issue 3 Pages 505-510
Ari X-ray diffraction method has been developed for the determination of silica content of B--eucryptite solid solution precipitated in glass-ceramics. B-Eucryptite solid solytions.of Varioug silica content were prepared by the crystallization of glass technique, and d-spacings corresponding to (514), (406), (220), (206) and (114) lines were measured to obtain cali.braQon curvesMDThe Tocalibtation curves, showing the correlation between lattice constaRts and silica content of the solid solution had bent at the composition of Li20-A1203e3 SiO2 and Li20.A1203e 4SiO2.This phenomenon was explained on the basis of repulsive fore betwee-n lith um.iops, or litAium ion'and other cations in the lattice.On the low silica content region, the lattice constants also depended upon the crystallizing temperature and time. However, it was foupd that the calibrat- ocurve, showing .the correlation of (406) interplanar spacing against the silicacontent was linear irrespective of the crystallizing temperature over all solid solutiqn ladday eO1ule time required for ari analysis was dbout one hour w.hep the ayerage -of .thre.e time measurgments the interplanar spacing was used. The absolute values of the lattice constants 6Et5ihed in this woik can bMe also used for the determination anywhere it. is required, if correction is made for systematlc error
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