Non-volatile flip-flop with soft error tolerant capability using DICE and C-element

Abstract

In recent years, soft errors on VLSI have increased due to miniaturization, higher integration, and lower supply voltages. A soft error is a temporary error caused by the impact of high-energy particles, such as neutrons from cosmic rays, on VLSI. Recent studies have proposed flip-flops (FFs) tolerant to soft errors occurring on VLSI system scaling continues. Non-volatile (NV) FFs have been studied to reduce the power consumption of battery-powered devices. This paper has presented a design of NV-FFs with soft-error tolerant capability using the DICE (dual interlocked storage cell) structure, which is a soft-error tolerant structure.