Microscopy of fluctuations

Abstract

An experimental method for probing and mapping fluctuations in a material by detecting fluctuation-induced electromagnetic evanescent waves on the material surface is described.

Examples of applications are described such as (i) imaging of thermally activated evanescent waves on metals, (ii) visualization of current-induced hot electrons in narrow metal wires and (iii) the visualization of hot electrons in GaAs/AlGaAs nano-devices.