Exploring magic equations for soft error reliability

Abstract

Semiconductor devices are inherently sensitive to radiation, exhibiting malfunctions called soft errors. Although soft error is sometimes misunderstood as an old and settled issue, it still makes marked negative impacts on our social and economic activities. Today’s testing of soft-error reliability relies heavily on exposure to radiation. Regardless of whether an effort aims for space or terrestrial applications, it is hard to know how reliable a chip is until tested with radiation. Since soft error is triggered by an energy deposition from radiation, the bombardment of radiation seems essential and unavoidable in test―Is it really true? The present study is attempting to answer this question. The authors are exploring equations capable of assessing soft error reliability proactively―as if by magic―without using radiation.