Oyo Buturi
Online ISSN : 2188-2290
Print ISSN : 0369-8009
Measurement of Reflection Characteristics of Rough Surfaces by the Use of a Frequeucy Chart
Shun-ichi TANAKANoriyuki NOGUCHIMakoto WATANABETsunehiko TAKAHASHI
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JOURNAL FREE ACCESS

1962 Volume 31 Issue 3 Pages 216-221

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Abstract
Reflection characteristics of various rough surfaces are measured at large specular angles with a goniophotometer. A square-wave chart illuminated by a source is placed at the focal plane of the collimator lens. The chart is scanned and photocurrent generated in a photomultiplier tube placed behind a slit of receiver system is recorded. Relation between spatial frequency and the contrast of record is investigated and the k value of Jentzsch's equation,
2hcosθc=λ/k,
is determined, where h is the roughness of the sample, λ the wavelength of light, θc the critical angle of the so-called Sheen given as the angle at which the value of contrast becomes zero. The k value of ground glass is found independent of the wavelength of light or the roughness of the sample; it is 2_??_3 when h is taken as the central line average roughness.
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© The Japan Society of Applied Physics
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