Oyo Buturi
Online ISSN : 2188-2290
Print ISSN : 0369-8009
A Measurement of Interface Properties in MOS by Electroreflectance
Akihiro MORITANIKiyotoshi MISAWAJunkichi NAKAI
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1976 Volume 45 Issue 4 Pages 349-354

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© The Japan Society of Applied Physics
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