Mixed conduction in CeO2-type oxides

Atsushi Mineshige; Noriyuki Ohmura; Masafumi Kobune; Tetuo Yazawa

doi:10.14853/pcersj.2003S.0.516.0

Preprints of Annual Meeting of The Ceramic Society of Japan
Preprints of Fall Meeting of The Ceramic Society of Japan

Preprints of Annual Meeting of The Ceramic Society of Japan, 2003

Session ID : 2J05

DOI https://doi.org/10.14853/pcersj.2003S.0.516.0

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Host: The Ceramic Society of Japan

Mixed conduction in CeO2-type oxides

*Atsushi Mineshige, Noriyuki Ohmura, Masafumi Kobune, Tetuo Yazawa

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Abstract

P(O₂) or oxygen chemical potential variation in Ce_0.8M_0.2O₂-δ (M; Sm and Y) under SOFC operating conditions was determined using Raman spectroscopy, by which the information of oxygen vacancies can be obtained. Under open-circuit conditions, the P(O₂) variation revealed that oxygen chemical potential was quite low in most part of the sample and thus only a thin layer remained as electronically insulating near the sample/air interface.

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