Abstract
Ferroelectric Pb(Zr,Ti)O3 (PZT) films were deposited directly on glass substrates at room temperature by aerosol deposition (AD). The reflectance and transmittance for the film samples were measured using UV-NIR Spectroscopy to analyze the band structures of the PZT films. By fitting the measured data with an optical model, the band gaps of the as-deposited and annealed films were estimated. The estimated results show that the band structure of the films is changed by annealing.