Electrical properties of La₁₀Si₆O₂₇-based oxides

Abstract

Electrical conductivity of La10Si6O27-based oxides system were studied. Highly dense (relative density is about 95%) La10Si6O27 sample could be prepared by a simple solid-state reaction. The x-ray diffraction patterns for the samples were almost the same as that of the JCPDS card (#53-0291, La10Si6O27). The electrical conducting behavior of non-doped sample was almost ionic, and its conductivity was about 10-2 S X cm-1 at 873 K. The conductivity increased by doping such as Mg, Al or Ca ions.