Host: The Ceramic Society of Japan
PbMg0.047Nb0.095Zr0.416Ti0.442O3 (PMNZT) films were fabricated using a spin-coating technique onto Pt(100)/MgO(100) substrates by metalorganic decomposition (MOD). The PMNZT films HIP-treated at 49-196 MPa were characterized by x-ray diffraction (XRD), transmission electron microscopy (TEM) and piezoelectric response microscopy (PFM). The PMNZT films HIP-treated are shown to be potential and reliable materials for piezo- and ferroelectric applications such as actuators and resonators.