Abstract
Manganese dioxide thin films were deposited on conductive glass slides from aqueous solutions using cetyltrimethylammonium chloride as a template. Gamma-MnO2 thin films with lamellar structure with a 3nm layer distance were obtained when CTAC was used. The films were characterized for electrochemical behavior by cyclic voltammetry in a sodium sulfate solution. The lamellar-structured thin film, after being calcined at 373K, gave a high current response. this thin film may be a potential candidate of the active material in redox capacitors.
