Structure of Developed Silver Filaments Studied by High Resolution Electron Microscopy

Abstract

Microstructures in developed silver filaments have been examined by high resolution electron microscooy.
It was confirmed that thin filaments (ca. 20 nm in diameter) are nearly defect-free, whereas thicker filaments (>20 nm) have a number of crystal defects such as stacking faults, twin boundaries, and small angle tilt grain boundaries containing edge dislocations.