Abstract
The size of crystallites in mono-dispersed cubic silver bromide grains was measured by applying powder X-ray diffraction method and Scherrer's equation to the grains suspended in swollen gelatin layers. In the case of the grains prepared by a controlled double jet method, the size of crystallites was equal to the edge length for the grains with edge lengths smaller than 400 nm. This result proved the usefulness of the above-stated method for the measurement of the size of crystallites and also the evaluation of the presence of any crystal defect in each grain. In the case of the grains, which were precipitated in the presence of a sensitizing dye and potassium iodide, the size of crystallites was smaller than the edge length, indicating the discontinuities in the grains introduced during the precipitation.
