PLANT MORPHOLOGY
Online ISSN : 1884-4154
Print ISSN : 0918-9726
ISSN-L : 0918-9726
Invited Review
The world of plant organelles opened by serial section SEM
Noriko Nagata
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JOURNAL FREE ACCESS

2020 Volume 32 Issue 1 Pages 11-17

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Abstract

The scanning electron microscopy (SEM) produces images by scanning the sample surface with an electron beam to detect backscattered electrons and/or secondary electrons. SEM has been widely used for the imaging tiny structures that are difficult to observe with optical microscopes. In recent years, SEM has been improved on various kinds of parts such as detectors and electron guns and can be used for the analysis of biological samples like tissues and cells by improving sample preparation methods such as fixation, heavy metal staining, resin embedding and coating. In this article, we describe new techniques for small organisms, plant tissues and cells using SEM and introduce new findings obtained from this observation.

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© 2020 The Japanese Society of Plant Morphology
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