Proceedings of JSPE Semestrial Meeting
2004 JSPE Spring Meeting
Session ID : H04
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Absolute shape measurements for silicon single crystal plane mirror using near-infrared interferometry
Junichi Utikosi*Taichiro OkamotoAmane TsudaMizuho Morita
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract

[in Japanese]

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© 2004 The Japan Society for Precision Engineering
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