Proceedings of JSPE Semestrial Meeting
2004 JSPE Spring Meeting
Session ID : I24
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Host: The Japan Society of Precision Engineering

Development of Fabricating Method of Nanoscale Pit with High Aspect Ratio Using Carbon Nanotube Probe
*Norikazu Arima, Akihito Matsumuro
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Keywords: carbon nanotube probe, scanning tunneling microscope
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[in Japanese]
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© 2004 The Japan Society for Precision Engineering
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