Direct measurement of rotating error for precision spindle using atom-tracking control

Abstract

We have developed "atom-tracking control" using regular crystalline surface and scanning tunneling microscope (STM). In the control, a STM tip can be locked onto an atomic apex point. In this report, we propose "direct measurement of rotating error for precision spindle using atom tracking control". In the method, a regular crystalline surface is attached to one end of the spindle and a specific atom point of the surface near by central point of rotation can be traced by a STM tip using atom-tracking control. From the 3-D traced displacement of the tip, the rotating error can be directly determined. In the report, principle and instrumentation are described.