Proceedings of JSPE Semestrial Meeting
2006 JSPE Autumn Meeting
Session ID : G04
Conference information

The newest trend of a semiconductor device and the planarization CMP
*Yohei YamadaTakahiro SugayaMasanori Kawakubo
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Abstract
This paper describes the view of the CMP (chemical-mechanical polishing) technology corresponding to Cu
Content from these authors
© 2006 The Japan Society for Precision Engineering
Previous article Next article
feedback
Top