Abstract
It is very difficult to measure the wide–angle profile precisely in the conventional way with the vertical probe. In this report, a new profile measuring methods with slant probes are proposed. The measuring area with a probe is limited within about 45 or 60 degrees, and a slant probe or multiple probes located in different angles are used. The multiple measured data are connected to evaluated the whole surface profile. The profile measurement on the machine with a slant probe is easier. The additional centering procedure or the additional evaluation of the attached angle of the probe is not necessary because the axis of the axis–symmetrical measured object and the axis of the rotation table are precisely overlapped.
